TEST_NAME : Wafer
TEST_DATE : 24_08_22-18_35_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-011-017-010-11 | FUSED_ID : 6359364768384487595
  IC_TEMP :  -59.04 | VDDM : 1123.71 | AUX_INT :   -8.52 | CsaBias :   66.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25737e-03 / 2
  ADC_P0  : -8.52239e-03 ± 2.40341e-02
  ADC_P1  : 8.38787e-03 ± 5.93101e-04
  ADC_P2  : -5.59777e-06 ± 2.90857e-06
  CSA_Chi2/NDF : 1.58967e-04 / 2
  CSA_P0  : 5.82143e-02 ± 8.40960e-03
  CSA_P1  : 1.02231e-02 ± 6.33603e-04
  CSA_P2  : -5.14292e-05 ± 9.64902e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [2, 8, 14, 21, 29, 39, 51, 52, 65, 71, 81, 92, 96, 112, 115, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [6, 11, 25, 30, 36, 50, 53, 79, 82, 90, 91, 92, 98, 100, 122, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3725', '1.800', '0.1694', '1.799', '0.0932', '7.000', '0.7074', 1, 1, 1, 1, 1724344552.9789393]
VI_after__Init : ['1.202', '0.3728', '1.800', '0.1695', '1.799', '0.0875', '7.000', '0.7073', 1, 1, 1, 1, 1724344561.805289]
VI_at__the_End : ['1.201', '0.4920', '1.800', '0.1384', '1.803', '0.1128', '7.000', '0.7083', 1, 1, 1, 1, 1724344628.7960477]