TEST_NAME : Wafer
TEST_DATE : 24_10_07-15_48_40
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-002-013-10 | FUSED_ID : 6359364768413786330
  IC_TEMP :  -80.13 | VDDM : 1109.79 | AUX_INT :  -11.79 | CsaBias :   50.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.16625e-03 / 2
  ADC_P0  : -1.17854e-02 ± 3.15450e-02
  ADC_P1  : 9.02097e-03 ± 8.04278e-04
  ADC_P2  : -7.56391e-06 ± 4.09042e-06
  CSA_Chi2/NDF : 1.97188e-04 / 2
  CSA_P0  : 5.50478e-02 ± 9.36619e-03
  CSA_P1  : 9.78096e-03 ± 7.05675e-04
  CSA_P2  : -5.93819e-05 ± 1.07466e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4158', '1.800', '0.1314', '1.800', '0.0950', '7.000', '0.7081', 1, 1, 1, 1, 1728308920.1494045]
VI_after__Init : ['1.201', '0.4165', '1.800', '0.1315', '1.802', '0.0891', '7.000', '0.7082', 1, 1, 1, 1, 1728308928.4084904]
VI_at__the_End : ['1.201', '0.4306', '1.800', '0.1306', '1.803', '0.1173', '7.000', '0.7088', 1, 1, 1, 1, 1728308998.7420032]