TEST_NAME : Wafer
TEST_DATE : 24_10_07-17_15_44
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-005-013-02 | FUSED_ID : 6359364768413798610
  IC_TEMP :  -62.46 | VDDM : 1113.99 | AUX_INT :   -8.53 | CsaBias :   66.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17895e-03 / 2
  ADC_P0  : -8.52977e-03 ± 2.32052e-02
  ADC_P1  : 8.42886e-03 ± 5.60985e-04
  ADC_P2  : -6.58917e-06 ± 2.68303e-06
  CSA_Chi2/NDF : 1.47035e-04 / 2
  CSA_P0  : 5.69152e-02 ± 8.08784e-03
  CSA_P1  : 9.50701e-03 ± 6.09361e-04
  CSA_P2  : -4.58083e-05 ± 9.27984e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [24, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [40, 83]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2736', '1.800', '0.1490', '1.799', '0.0881', '7.000', '0.7082', 1, 1, 1, 1, 1728314143.6419215]
VI_after__Init : ['1.202', '0.2737', '1.800', '0.1489', '1.800', '0.0830', '7.000', '0.7082', 1, 1, 1, 1, 1728314152.5292227]
VI_at__the_End : ['1.202', '0.4710', '1.800', '0.1369', '1.804', '0.1167', '7.000', '0.7089', 1, 1, 1, 1, 1728314207.5159867]