TEST_NAME : Wafer
TEST_DATE : 24_10_08-01_01_58
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-039-017-014-08 | FUSED_ID : 6359364768413847784
  IC_TEMP :  -55.97 | VDDM : 1123.22 | AUX_INT :   -8.30 | CsaBias :   89.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16864e-03 / 2
  ADC_P0  : -8.30113e-03 ± 2.31867e-02
  ADC_P1  : 8.18412e-03 ± 5.65435e-04
  ADC_P2  : -4.86756e-06 ± 2.74551e-06
  CSA_Chi2/NDF : 1.52953e-04 / 2
  CSA_P0  : 5.94882e-02 ± 8.24900e-03
  CSA_P1  : 1.00310e-02 ± 6.21502e-04
  CSA_P2  : -4.60570e-05 ± 9.46475e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [86, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3271', '1.800', '0.1853', '1.800', '0.0893', '7.000', '0.7079', 1, 1, 1, 1, 1728342118.082133]
VI_after__Init : ['1.202', '0.3272', '1.800', '0.1853', '1.799', '0.0837', '7.000', '0.7078', 1, 1, 1, 1, 1728342126.8004086]
VI_at__the_End : ['1.202', '0.5052', '1.800', '0.1397', '1.801', '0.1106', '7.000', '0.7087', 1, 1, 1, 1, 1728342189.9096398]