TEST_NAME : Wafer
TEST_DATE : 24_08_12-15_40_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-003-005-022-09 | FUSED_ID : 6359364768376050025
  IC_TEMP :  360.68 | VDDM :   -7.37 | AUX_INT :   -7.37 | CsaBias :   -7.37
  CONF_FAIL_REG : 4235
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 0.00000e+00 / 2
  ADC_P0  : -7.36518e-03 ± 1.91025e-02
  ADC_P1  : 8.24230e-03 ± 4.63116e-04
  ADC_P2  : -5.45787e-06 ± 2.23138e-06
  CSA_Chi2/NDF : 3.07913e-07 / 2
  CSA_P0  : 1.68114e-01 ± 3.70115e-04
  CSA_P1  : -2.62388e-05 ± 2.78855e-05
  CSA_P2  : -2.63607e-08 ± 4.24663e-07
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [0, 1, 4, 34, 35, 61, 66, 75, 86, 87, 93, 99, 109, 111, 115, 121, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [4, 16, 40, 41, 43, 55, 105, 106, 112, 113, 115, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1702', '0.373', '0.2501', '1.799', '0.0674', '7.000', '0.7083', 1, 1, 1, 1, 1723470026.6583927]
VI_after__Init : ['1.202', '0.1702', '0.373', '0.2501', '1.800', '0.0600', '7.000', '0.7075', 1, 1, 1, 1, 1723470035.5317218]
VI_at__the_End : ['1.201', '0.1669', '0.388', '0.2500', '1.806', '0.0652', '7.000', '0.7083', 1, 1, 1, 1, 1723470094.4943762]