TEST_NAME : Wafer
TEST_DATE : 24_08_13-10_53_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-003-015-025-06 | FUSED_ID : 6359364768376091030
  IC_TEMP :  -16.72 | VDDM : 1215.73 | AUX_INT : -1074.89 | CsaBias : -670.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.27652e-02 / 2
  ADC_P0  : -1.25174e+00 ± 6.04364e-01
  ADC_P1  : 2.57001e-02 ± 1.00009e-02
  ADC_P2  : -6.22812e-05 ± 3.46243e-05
  CSA_Chi2/NDF : 7.22320e-05 / 2
  CSA_P0  : 5.94959e-02 ± 5.66875e-03
  CSA_P1  : 9.39773e-03 ± 4.27099e-04
  CSA_P2  : -3.39228e-05 ± 6.50422e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [9, 27, 51, 52, 65, 67, 75, 81, 88, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [18, 41, 49, 50, 66, 71, 72, 74, 80, 93, 96, 99, 100, 106, 114, 121, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2635', '1.800', '0.1456', '1.799', '0.0905', '7.000', '0.7080', 1, 1, 1, 1, 1723539217.0661037]
VI_after__Init : ['1.200', '0.2632', '1.800', '0.1455', '1.799', '0.0851', '7.000', '0.7076', 1, 1, 1, 1, 1723539225.8523712]
VI_at__the_End : ['1.202', '0.5163', '1.800', '0.1342', '1.802', '0.1077', '7.000', '0.7086', 1, 1, 1, 1, 1723539297.4118283]