TEST_NAME : Wafer
TEST_DATE : 24_08_13-11_56_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-003-016-019-14 | FUSED_ID : 6359364768376095038
  IC_TEMP :  -43.95 | VDDM : 1115.43 | AUX_INT :   -6.03 | CsaBias :   90.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.66981e-04 / 2
  ADC_P0  : -6.03033e-03 ± 2.10879e-02
  ADC_P1  : 8.06481e-03 ± 5.12938e-04
  ADC_P2  : -4.80405e-06 ± 2.46043e-06
  CSA_Chi2/NDF : 5.89242e-05 / 2
  CSA_P0  : 5.95861e-02 ± 5.11999e-03
  CSA_P1  : 9.21367e-03 ± 3.85755e-04
  CSA_P2  : -3.40269e-05 ± 5.87458e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [15, 36, 61, 62, 65, 71, 77, 96, 99, 100, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [2, 8, 18, 22, 40, 49, 56, 57, 58, 68, 69, 75, 82, 100, 105, 107, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2338', '1.800', '0.1553', '1.799', '0.0831', '7.000', '0.7073', 1, 1, 1, 1, 1723542975.936158]
VI_after__Init : ['1.202', '0.2338', '1.800', '0.1551', '1.801', '0.0775', '7.000', '0.7072', 1, 1, 1, 1, 1723542984.0475378]
VI_at__the_End : ['1.202', '0.5039', '1.800', '0.1371', '1.803', '0.1083', '7.000', '0.7082', 1, 1, 1, 1, 1723543040.068641]