TEST_NAME : Wafer
TEST_DATE : 24_08_13-12_03_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-003-016-023-14 | FUSED_ID : 6359364768376095102
  IC_TEMP :  -36.49 | VDDM : 1213.37 | AUX_INT : -1075.87 | CsaBias : -707.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.39318e-02 / 2
  ADC_P0  : -1.07587e+00 ± 5.52141e-01
  ADC_P1  : 2.25532e-02 ± 9.55821e-03
  ADC_P2  : -5.19881e-05 ± 3.46752e-05
  CSA_Chi2/NDF : 4.65932e-05 / 2
  CSA_P0  : 5.83099e-02 ± 4.55285e-03
  CSA_P1  : 9.28434e-03 ± 3.43025e-04
  CSA_P2  : -3.39150e-05 ± 5.22386e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [22, 35, 41, 42, 54, 76, 80, 86, 88, 95, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [8, 14, 42, 47, 50, 60, 64, 83, 88, 89, 104, 125, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1175', '1.799', '0.1497', '1.799', '0.0828', '7.000', '0.7083', 1, 1, 1, 1, 1723543400.1486914]
VI_after__Init : ['1.202', '0.1174', '1.800', '0.1497', '1.800', '0.0753', '7.000', '0.7072', 1, 1, 1, 1, 1723543408.8689978]
VI_at__the_End : ['1.201', '0.5066', '1.800', '0.1340', '1.805', '0.1072', '7.000', '0.7083', 1, 1, 1, 1, 1723543475.6570837]