TEST_NAME : Wafer
TEST_DATE : 24_08_13-12_27_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-003-017-009-04 | FUSED_ID : 6359364768376098964
  IC_TEMP :  -43.23 | VDDM : 1146.34 | AUX_INT : -129.99 | CsaBias :  -16.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21604e-03 / 2
  ADC_P0  : -1.29993e-01 ± 2.99851e-02
  ADC_P1  : 9.60445e-03 ± 6.72679e-04
  ADC_P2  : -1.04156e-05 ± 2.96038e-06
  CSA_Chi2/NDF : 5.70813e-05 / 2
  CSA_P0  : 5.72245e-02 ± 5.03929e-03
  CSA_P1  : 9.15652e-03 ± 3.79674e-04
  CSA_P2  : -3.44246e-05 ± 5.78199e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [9, 16, 20, 23, 25, 27, 33, 34, 37, 45, 54, 60, 79, 114, 117, 123, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [0, 3, 10, 16, 23, 28, 54, 65, 73, 86, 87, 93, 113, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3585', '1.800', '0.1622', '1.800', '0.0957', '7.000', '0.7081', 1, 1, 1, 1, 1723544878.9041328]
VI_after__Init : ['1.201', '0.3584', '1.800', '0.1622', '1.800', '0.0884', '7.000', '0.7072', 1, 1, 1, 1, 1723544886.9554517]
VI_at__the_End : ['1.202', '0.4947', '1.801', '0.1334', '1.805', '0.1086', '7.000', '0.7080', 1, 1, 1, 1, 1723544948.338043]