TEST_NAME : Wafer
TEST_DATE : 24_08_14-00_24_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-004-015-009-11 | FUSED_ID : 6359364768377139355
  IC_TEMP :  -60.52 | VDDM : 1124.15 | AUX_INT :   -7.42 | CsaBias :   51.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.71313e-04 / 2
  ADC_P0  : -7.41840e-03 ± 2.11155e-02
  ADC_P1  : 8.46807e-03 ± 5.30252e-04
  ADC_P2  : -5.55641e-06 ± 2.64171e-06
  CSA_Chi2/NDF : 1.96783e-04 / 2
  CSA_P0  : 5.84302e-02 ± 9.35655e-03
  CSA_P1  : 1.02442e-02 ± 7.04949e-04
  CSA_P2  : -5.58559e-05 ± 1.07355e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [0, 2, 26, 31, 49, 51, 53, 68, 71, 76, 86, 89, 92, 94, 104, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [10, 21, 22, 23, 30, 32, 64, 66, 76, 82, 88, 94, 115, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4162', '1.800', '0.1314', '1.799', '0.0942', '7.000', '0.7072', 1, 1, 1, 1, 1723587844.6361988]
VI_after__Init : ['1.202', '0.4163', '1.800', '0.1314', '1.799', '0.0888', '7.000', '0.7073', 1, 1, 1, 1, 1723587852.8105497]
VI_at__the_End : ['1.202', '0.4773', '1.800', '0.1365', '1.806', '0.1144', '7.000', '0.7078', 1, 1, 1, 1, 1723587918.5239768]