TEST_NAME : Wafer
TEST_DATE : 24_08_14-18_37_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-005-017-010-06 | FUSED_ID : 6359364768378196134
  IC_TEMP :  -59.61 | VDDM : 1123.22 | AUX_INT :  -10.38 | CsaBias :   64.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63743e-03 / 2
  ADC_P0  : -1.03774e-02 ± 2.74344e-02
  ADC_P1  : 8.34187e-03 ± 6.66173e-04
  ADC_P2  : -5.52726e-06 ± 3.23725e-06
  CSA_Chi2/NDF : 1.74628e-04 / 2
  CSA_P0  : 5.86779e-02 ± 8.81413e-03
  CSA_P1  : 1.01624e-02 ± 6.64081e-04
  CSA_P2  : -5.37018e-05 ± 1.01132e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [19, 22, 30, 31, 37, 39, 56, 77, 82, 100, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [3, 9, 17, 22, 26, 29, 37, 40, 44, 54, 55, 57, 62, 89, 107, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2484', '1.799', '0.1595', '1.800', '0.0973', '7.000', '0.7086', 1, 1, 1, 1, 1723653450.517428]
VI_after__Init : ['1.201', '0.2485', '1.800', '0.1596', '1.799', '0.0894', '7.000', '0.7075', 1, 1, 1, 1, 1723653458.678528]
VI_at__the_End : ['1.201', '0.4786', '1.800', '0.1359', '1.800', '0.1141', '7.000', '0.7086', 1, 1, 1, 1, 1723653523.3983765]