TEST_NAME : Wafer
TEST_DATE : 24_08_15-10_46_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-006-017-04 | FUSED_ID : 6359364768379199764
  IC_TEMP :  -52.40 | VDDM : 1126.42 | AUX_INT :   -7.35 | CsaBias :   61.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05905e-03 / 2
  ADC_P0  : -7.35315e-03 ± 2.20494e-02
  ADC_P1  : 8.63245e-03 ± 5.63691e-04
  ADC_P2  : -5.93760e-06 ± 2.85077e-06
  CSA_Chi2/NDF : 1.57080e-04 / 2
  CSA_P0  : 6.11724e-02 ± 8.35955e-03
  CSA_P1  : 1.00892e-02 ± 6.29832e-04
  CSA_P2  : -4.96808e-05 ± 9.59160e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [0, 9, 13, 16, 18, 22, 30, 33, 40, 42, 54, 56, 60, 70, 94, 113, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [4, 5, 13, 30, 48, 61, 63, 78, 88, 93, 101, 110, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4810', '1.800', '0.1731', '1.800', '0.0951', '7.000', '0.7070', 1, 1, 1, 1, 1723711587.0122929]
VI_after__Init : ['1.202', '0.4815', '1.800', '0.1733', '1.800', '0.0895', '7.000', '0.7070', 1, 1, 1, 1, 1723711594.4787092]
VI_at__the_End : ['1.202', '0.4953', '1.800', '0.1396', '1.800', '0.1121', '7.000', '0.7079', 1, 1, 1, 1, 1723711650.0012484]