TEST_NAME : Wafer
TEST_DATE : 24_08_15-13_22_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-010-004-09 | FUSED_ID : 6359364768379215945
  IC_TEMP :  -69.19 | VDDM : 1115.47 | AUX_INT :  -10.06 | CsaBias :   57.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63603e-03 / 2
  ADC_P0  : -1.00627e-02 ± 2.74152e-02
  ADC_P1  : 8.52194e-03 ± 6.75188e-04
  ADC_P2  : -6.19596e-06 ± 3.31091e-06
  CSA_Chi2/NDF : 1.67351e-04 / 2
  CSA_P0  : 5.76421e-02 ± 8.62852e-03
  CSA_P1  : 9.97124e-03 ± 6.50096e-04
  CSA_P2  : -5.76378e-05 ± 9.90020e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [7, 33, 35, 37, 43, 48, 53, 56, 75, 78, 79, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [0, 7, 19, 22, 33, 41, 49, 54, 70, 72, 73, 82, 89, 93, 94, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2867', '1.800', '0.1522', '1.800', '0.0944', '7.000', '0.7077', 1, 1, 1, 1, 1723720930.2093186]
VI_after__Init : ['1.202', '0.2869', '1.800', '0.1523', '1.802', '0.0870', '7.000', '0.7069', 1, 1, 1, 1, 1723720937.485702]
VI_at__the_End : ['1.202', '0.4525', '1.800', '0.1352', '1.802', '0.1177', '7.000', '0.7080', 1, 1, 1, 1, 1723720992.8377736]