TEST_NAME : Wafer
TEST_DATE : 24_08_15-13_23_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-010-005-09 | FUSED_ID : 6359364768379215961
  IC_TEMP :  -68.94 | VDDM : 1111.63 | AUX_INT :  -10.94 | CsaBias :   57.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.93318e-03 / 2
  ADC_P0  : -1.09407e-02 ± 2.98328e-02
  ADC_P1  : 8.58434e-03 ± 7.39674e-04
  ADC_P2  : -6.13348e-06 ± 3.66485e-06
  CSA_Chi2/NDF : 1.72093e-04 / 2
  CSA_P0  : 5.75620e-02 ± 8.74992e-03
  CSA_P1  : 1.02172e-02 ± 6.59243e-04
  CSA_P2  : -6.25909e-05 ± 1.00395e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [6, 18, 26, 31, 53, 80, 118, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [1, 6, 16, 23, 30, 32, 37, 42, 59, 64, 84, 125, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2488', '1.800', '0.1502', '1.799', '0.0936', '7.000', '0.7072', 1, 1, 1, 1, 1723721036.544786]
VI_after__Init : ['1.202', '0.2489', '1.800', '0.1503', '1.801', '0.0880', '7.000', '0.7072', 1, 1, 1, 1, 1723721044.5272443]
VI_at__the_End : ['1.202', '0.4502', '1.800', '0.1370', '1.802', '0.1157', '7.000', '0.7079', 1, 1, 1, 1, 1723721098.619562]