TEST_NAME : Wafer
TEST_DATE : 24_08_15-13_36_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-010-012-09 | FUSED_ID : 6359364768379216073
  IC_TEMP :  -62.70 | VDDM : 1129.01 | AUX_INT :   -9.39 | CsaBias :   61.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21470e-03 / 2
  ADC_P0  : -9.39171e-03 ± 2.35174e-02
  ADC_P1  : 8.94852e-03 ± 5.96966e-04
  ADC_P2  : -7.56875e-06 ± 3.01158e-06
  CSA_Chi2/NDF : 1.48114e-04 / 2
  CSA_P0  : 5.84392e-02 ± 8.11747e-03
  CSA_P1  : 1.00882e-02 ± 6.11593e-04
  CSA_P2  : -5.54238e-05 ± 9.31384e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  31
 | N_BROKEN_FAST :  [1, 2, 3, 28, 29, 37, 41, 42, 43, 44]
 | N_BROKEN_SLOW :  [3, 4, 7, 9, 10, 12, 13, 16, 18, 22, 23, 25, 29, 30, 33, 36, 39, 41, 42, 43, 44]
   P_BROKEN_DISC :  30
 | P_BROKEN_FAST :  [5, 6, 13, 14, 22, 41, 42, 43, 44]
 | P_BROKEN_SLOW :  [0, 1, 6, 7, 11, 12, 13, 15, 19, 21, 22, 24, 25, 27, 29, 30, 39, 41, 42, 43, 44]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.184', '0.1412', '1.800', '0.0847', '1.799', '0.0898', '7.000', '0.7078', 1, 1, 1, 1, 1723721793.3285565]
VI_after__Init : ['1.201', '0.1415', '1.800', '0.0847', '1.804', '0.0828', '7.000', '0.7071', 1, 1, 1, 1, 1723721801.2829223]
VI_at__the_End : ['1.201', '0.4710', '1.800', '0.1370', '1.803', '0.1135', '7.000', '0.7078', 1, 1, 1, 1, 1723721857.0187624]