TEST_NAME : Wafer
TEST_DATE : 24_08_15-13_43_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-010-016-14 | FUSED_ID : 6359364768379216142
  IC_TEMP :  -54.79 | VDDM : 1125.19 | AUX_INT :   -8.15 | CsaBias :   79.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00565e-03 / 2
  ADC_P0  : -8.15289e-03 ± 2.14325e-02
  ADC_P1  : 8.84324e-03 ± 5.50309e-04
  ADC_P2  : -6.75547e-06 ± 2.80385e-06
  CSA_Chi2/NDF : 1.40132e-04 / 2
  CSA_P0  : 6.06003e-02 ± 7.89570e-03
  CSA_P1  : 1.02486e-02 ± 5.94884e-04
  CSA_P2  : -5.26055e-05 ± 9.05938e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [4, 16, 19, 21, 46, 65, 70, 87, 97, 107, 114, 119, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [18, 24, 36, 42, 50, 51, 66, 74, 82, 96, 103, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2942', '1.800', '0.1419', '1.799', '0.0886', '7.000', '0.7072', 1, 1, 1, 1, 1723722201.5220423]
VI_after__Init : ['1.201', '0.2941', '1.800', '0.1419', '1.800', '0.0834', '7.001', '0.7071', 1, 1, 1, 1, 1723722209.5364556]
VI_at__the_End : ['1.201', '0.4931', '1.800', '0.1405', '1.800', '0.1118', '7.000', '0.7079', 1, 1, 1, 1, 1723722265.7852352]