TEST_NAME : Wafer
TEST_DATE : 24_08_15-13_46_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-010-018-14 | FUSED_ID : 6359364768379216174
  IC_TEMP :  -51.72 | VDDM : 1126.07 | AUX_INT :   -8.18 | CsaBias :   81.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18578e-03 / 2
  ADC_P0  : -8.18148e-03 ± 2.33490e-02
  ADC_P1  : 8.19964e-03 ± 5.67529e-04
  ADC_P2  : -5.13880e-06 ± 2.74034e-06
  CSA_Chi2/NDF : 9.59893e-05 / 2
  CSA_P0  : 5.84437e-02 ± 6.53482e-03
  CSA_P1  : 9.62738e-03 ± 4.92352e-04
  CSA_P2  : -4.43232e-05 ± 7.49793e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [3, 7, 12, 26, 28, 30, 42, 48, 50, 62, 63, 79, 86, 116, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [3, 8, 9, 27, 31, 51, 59, 60, 64, 75, 80, 96, 97, 98, 108, 110, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2912', '1.800', '0.1840', '1.799', '0.0849', '7.000', '0.7072', 1, 1, 1, 1, 1723722413.5701077]
VI_after__Init : ['1.201', '0.2912', '1.799', '0.1840', '1.801', '0.0801', '6.997', '0.7070', 1, 1, 1, 1, 1723722421.5235279]
VI_at__the_End : ['1.201', '0.4863', '1.800', '0.1349', '1.799', '0.1123', '7.000', '0.7080', 1, 1, 1, 1, 1723722477.773291]