TEST_NAME : Wafer
TEST_DATE : 24_08_15-14_48_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-011-002-04 | FUSED_ID : 6359364768379220004
  IC_TEMP :  -71.99 | VDDM : 1116.76 | AUX_INT :   -9.84 | CsaBias :   54.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54792e-03 / 2
  ADC_P0  : -9.83765e-03 ± 2.66427e-02
  ADC_P1  : 9.19579e-03 ± 7.04350e-04
  ADC_P2  : -7.47861e-06 ± 3.70277e-06
  CSA_Chi2/NDF : 1.88601e-04 / 2
  CSA_P0  : 5.97797e-02 ± 9.15997e-03
  CSA_P1  : 1.02054e-02 ± 6.90138e-04
  CSA_P2  : -6.13210e-05 ± 1.05100e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [0, 10, 22, 25, 41, 53, 55, 71, 90, 92, 93, 111, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [3, 9, 13, 15, 28, 36, 52, 53, 57, 60, 73, 85, 98, 116, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3005', '1.800', '0.1489', '1.799', '0.0934', '6.999', '0.7074', 1, 1, 1, 1, 1723726129.8208435]
VI_after__Init : ['1.202', '0.3009', '1.800', '0.1492', '1.800', '0.0872', '7.000', '0.7075', 1, 1, 1, 1, 1723726137.837235]
VI_at__the_End : ['1.201', '0.4546', '1.800', '0.1381', '1.804', '0.1174', '7.000', '0.7081', 1, 1, 1, 1, 1723726192.5950825]