TEST_NAME : Wafer
TEST_DATE : 24_08_15-14_45_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-011-004-04 | FUSED_ID : 6359364768379220036
  IC_TEMP :  -67.50 | VDDM : 1119.62 | AUX_INT :   -7.39 | CsaBias :   61.44
  CONF_FAIL_REG : 1
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.51679e-04 / 2
  ADC_P0  : -7.38994e-03 ± 2.08457e-02
  ADC_P1  : 8.65719e-03 ± 5.23425e-04
  ADC_P2  : -6.73759e-06 ± 2.59454e-06
  CSA_Chi2/NDF : 1.82076e-04 / 2
  CSA_P0  : 5.79260e-02 ± 9.00014e-03
  CSA_P1  : 9.93765e-03 ± 6.78095e-04
  CSA_P2  : -5.39808e-05 ± 1.03266e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [4, 18, 39, 45, 52, 64, 65, 68, 72, 74, 77, 112, 114, 115, 116, 119, 120, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [3, 48, 49, 58, 70, 87, 95, 105, 112, 118, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2490', '1.800', '0.2422', '1.799', '0.0890', '7.000', '0.7083', 1, 1, 1, 1, 1723725917.522142]
VI_after__Init : ['1.201', '0.2490', '1.799', '0.2420', '1.800', '0.0807', '7.000', '0.7075', 1, 1, 1, 1, 1723725925.50961]
VI_at__the_End : ['1.201', '0.4656', '1.800', '0.1766', '1.801', '0.1135', '7.000', '0.7082', 1, 1, 1, 1, 1723725980.412369]