TEST_NAME : Wafer
TEST_DATE : 24_08_15-14_32_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-011-011-04 | FUSED_ID : 6359364768379220148
  IC_TEMP :  -63.02 | VDDM : 1113.08 | AUX_INT :   -9.48 | CsaBias :   59.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39727e-03 / 2
  ADC_P0  : -9.48095e-03 ± 2.53062e-02
  ADC_P1  : 8.62700e-03 ± 6.30671e-04
  ADC_P2  : -6.42611e-06 ± 3.12678e-06
  CSA_Chi2/NDF : 1.59885e-04 / 2
  CSA_P0  : 5.70230e-02 ± 8.43386e-03
  CSA_P1  : 1.01900e-02 ± 6.35431e-04
  CSA_P2  : -5.77542e-05 ± 9.67686e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [15, 35, 37, 51, 56, 62, 78, 83, 85, 96, 100, 103, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [0, 11, 34, 39, 55, 64, 74, 89, 95, 99, 104, 105, 108, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3002', '1.800', '0.1485', '1.799', '0.0956', '7.000', '0.7080', 1, 1, 1, 1, 1723725171.6603673]
VI_after__Init : ['1.201', '0.3002', '1.800', '0.1485', '1.800', '0.0884', '7.000', '0.7079', 1, 1, 1, 1, 1723725179.0105472]
VI_at__the_End : ['1.201', '0.4651', '1.800', '0.1394', '1.804', '0.1139', '7.000', '0.7082', 1, 1, 1, 1, 1723725234.2483706]