TEST_NAME : Wafer
TEST_DATE : 24_08_15-14_20_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-011-018-03 | FUSED_ID : 6359364768379220259
  IC_TEMP :  -55.52 | VDDM : 1134.88 | AUX_INT :   -8.88 | CsaBias :   67.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30503e-03 / 2
  ADC_P0  : -8.87797e-03 ± 2.44755e-02
  ADC_P1  : 8.57636e-03 ± 6.13356e-04
  ADC_P2  : -6.04100e-06 ± 3.05560e-06
  CSA_Chi2/NDF : 1.37915e-04 / 2
  CSA_P0  : 5.87279e-02 ± 7.83301e-03
  CSA_P1  : 1.01646e-02 ± 5.90161e-04
  CSA_P2  : -5.19677e-05 ± 8.98745e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [11, 12, 13, 18, 19, 45, 47, 59, 64, 73, 78, 92, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [4, 11, 14, 16, 28, 36, 84, 87, 98, 100, 102, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1899', '1.800', '0.1532', '1.800', '0.0887', '7.000', '0.7075', 1, 1, 1, 1, 1723724433.1102278]
VI_after__Init : ['1.201', '0.1901', '1.800', '0.1532', '1.800', '0.0836', '7.000', '0.7072', 1, 1, 1, 1, 1723724440.3776221]
VI_at__the_End : ['1.201', '0.4886', '1.800', '0.1377', '1.804', '0.1128', '7.000', '0.7080', 1, 1, 1, 1, 1723724497.3291593]