TEST_NAME : Wafer
TEST_DATE : 24_08_15-14_04_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-011-027-03 | FUSED_ID : 6359364768379220403
  IC_TEMP :  -63.90 | VDDM : 1200.43 | AUX_INT : -718.53 | CsaBias : -478.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45346e-02 / 2
  ADC_P0  : -7.18529e-01 ± 2.10613e-01
  ADC_P1  : 1.89852e-02 ± 4.11688e-03
  ADC_P2  : -4.28473e-05 ± 1.63249e-05
  CSA_Chi2/NDF : 8.15268e-05 / 2
  CSA_P0  : 5.73083e-02 ± 6.02244e-03
  CSA_P1  : 9.33352e-03 ± 4.53747e-04
  CSA_P2  : -3.65909e-05 ± 6.91004e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [0, 22, 26, 28, 43, 44, 46, 51, 52, 61, 62, 64, 81, 92, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [3, 12, 42, 54, 55, 57, 67, 75, 91, 107, 115, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3527', '1.800', '0.1514', '1.799', '0.0893', '7.000', '0.7074', 1, 1, 1, 1, 1723723477.1888595]
VI_after__Init : ['1.201', '0.3527', '1.800', '0.1514', '1.801', '0.0840', '7.000', '0.7072', 1, 1, 1, 1, 1723723485.1152053]
VI_at__the_End : ['1.201', '0.4969', '1.800', '0.1342', '1.803', '0.1109', '7.001', '0.7081', 1, 1, 1, 1, 1723723541.9085739]