TEST_NAME : Wafer
TEST_DATE : 24_08_15-14_52_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-012-003-12 | FUSED_ID : 6359364768379224124
  IC_TEMP :  -67.06 | VDDM : 1124.97 | AUX_INT :   -9.98 | CsaBias :   68.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64749e-03 / 2
  ADC_P0  : -9.97788e-03 ± 2.75404e-02
  ADC_P1  : 8.82383e-03 ± 7.09939e-04
  ADC_P2  : -6.20369e-06 ± 3.65039e-06
  CSA_Chi2/NDF : 2.24111e-04 / 2
  CSA_P0  : 6.01712e-02 ± 9.98514e-03
  CSA_P1  : 1.05988e-02 ± 7.52308e-04
  CSA_P2  : -6.18647e-05 ± 1.14568e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [5, 6, 14, 16, 38, 45, 50, 54, 93, 97, 99, 101, 104, 111, 119, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [1, 2, 51, 60, 61, 78, 79, 82, 94, 100, 105, 106, 109, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2212', '1.800', '0.1675', '1.800', '0.0883', '7.000', '0.7074', 1, 1, 1, 1, 1723726341.5765696]
VI_after__Init : ['1.202', '0.2215', '1.800', '0.1675', '1.800', '0.0828', '7.000', '0.7074', 1, 1, 1, 1, 1723726349.706955]
VI_at__the_End : ['1.202', '0.4767', '1.800', '0.1408', '1.803', '0.1156', '7.000', '0.7082', 1, 1, 1, 1, 1723726405.248741]