TEST_NAME : Wafer
TEST_DATE : 24_08_15-14_55_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-012-005-12 | FUSED_ID : 6359364768379224156
  IC_TEMP :  -63.10 | VDDM : 1126.62 | AUX_INT :   -9.35 | CsaBias :   69.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54915e-03 / 2
  ADC_P0  : -9.34816e-03 ± 2.67266e-02
  ADC_P1  : 8.76856e-03 ± 6.92908e-04
  ADC_P2  : -5.76733e-06 ± 3.58055e-06
  CSA_Chi2/NDF : 1.76772e-04 / 2
  CSA_P0  : 5.76623e-02 ± 8.86807e-03
  CSA_P1  : 1.04414e-02 ± 6.68145e-04
  CSA_P2  : -6.15516e-05 ± 1.01751e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [5, 7, 14, 26, 30, 36, 38, 43, 55, 61, 67, 80, 87, 96, 118, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [13, 20, 24, 31, 36, 43, 56, 61, 72, 85, 93, 103, 106, 112, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2263', '1.800', '0.1633', '1.800', '0.0872', '7.000', '0.7072', 1, 1, 1, 1, 1723726553.731275]
VI_after__Init : ['1.202', '0.2265', '1.800', '0.1634', '1.800', '0.0814', '7.000', '0.7076', 1, 1, 1, 1, 1723726561.745658]
VI_at__the_End : ['1.201', '0.4664', '1.800', '0.1376', '1.801', '0.1136', '7.000', '0.7080', 1, 1, 1, 1, 1723726616.3624678]