TEST_NAME : Wafer
TEST_DATE : 24_08_15-14_59_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-012-007-12 | FUSED_ID : 6359364768379224188
  IC_TEMP :  -63.16 | VDDM : 1117.57 | AUX_INT :   -9.87 | CsaBias :   69.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63383e-03 / 2
  ADC_P0  : -9.86901e-03 ± 2.74259e-02
  ADC_P1  : 8.81845e-03 ± 7.06989e-04
  ADC_P2  : -6.18834e-06 ± 3.63523e-06
  CSA_Chi2/NDF : 2.08732e-04 / 2
  CSA_P0  : 5.78302e-02 ± 9.63646e-03
  CSA_P1  : 1.05764e-02 ± 7.26037e-04
  CSA_P2  : -6.11406e-05 ± 1.10567e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [14, 19, 32, 38, 42, 50, 51, 59, 60, 65, 76, 77, 98, 99, 119, 120, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [46, 54, 62, 69, 73, 79, 80, 105, 107, 108, 112, 119, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4258', '1.800', '0.1445', '1.799', '0.0951', '7.000', '0.7072', 1, 1, 1, 1, 1723726766.2289474]
VI_after__Init : ['1.202', '0.4263', '1.800', '0.1440', '1.800', '0.0893', '7.000', '0.7072', 1, 1, 1, 1, 1723726774.2023375]
VI_at__the_End : ['1.202', '0.4765', '1.800', '0.1392', '1.804', '0.1140', '7.000', '0.7081', 1, 1, 1, 1, 1723726829.4600935]