TEST_NAME : Wafer
TEST_DATE : 24_08_15-15_17_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-012-017-11 | FUSED_ID : 6359364768379224347
  IC_TEMP :  -51.46 | VDDM : 1124.10 | AUX_INT :  -52.68 | CsaBias :   43.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37915e-03 / 2
  ADC_P0  : -5.26847e-02 ± 2.76470e-02
  ADC_P1  : 8.82846e-03 ± 6.73294e-04
  ADC_P2  : -6.55472e-06 ± 3.24661e-06
  CSA_Chi2/NDF : 1.29287e-04 / 2
  CSA_P0  : 6.00376e-02 ± 7.58403e-03
  CSA_P1  : 1.01944e-02 ± 5.71402e-04
  CSA_P2  : -5.15690e-05 ± 8.70178e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [1, 3, 9, 27, 43, 47, 58, 60, 79, 80, 93, 107, 115, 117, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [2, 10, 19, 35, 40, 53, 54, 77, 81, 84, 88, 89, 97, 107, 117, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4431', '1.800', '0.1346', '1.799', '0.0931', '7.000', '0.7072', 1, 1, 1, 1, 1723727825.5576057]
VI_after__Init : ['1.202', '0.4434', '1.800', '0.1347', '1.800', '0.0878', '7.000', '0.7072', 1, 1, 1, 1, 1723727833.5609546]
VI_at__the_End : ['1.201', '0.4935', '1.800', '0.1402', '1.800', '0.1129', '7.000', '0.7079', 1, 1, 1, 1, 1723727890.2197976]