TEST_NAME : Wafer
TEST_DATE : 24_08_15-16_17_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-013-003-01 | FUSED_ID : 6359364768379228209
  IC_TEMP :  -71.29 | VDDM : 1119.05 | AUX_INT :   -9.01 | CsaBias :   62.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.50540e-03 / 2
  ADC_P0  : -9.00940e-03 ± 2.63573e-02
  ADC_P1  : 8.93944e-03 ± 6.98532e-04
  ADC_P2  : -5.92714e-06 ± 3.68860e-06
  CSA_Chi2/NDF : 1.86904e-04 / 2
  CSA_P0  : 5.98138e-02 ± 9.11868e-03
  CSA_P1  : 1.04362e-02 ± 6.87026e-04
  CSA_P2  : -6.19389e-05 ± 1.04626e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [2, 12, 31, 35, 38, 42, 51, 88, 93, 108, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  20
 | P_BROKEN_FAST :  [15, 16, 32, 34, 46, 51, 66, 67, 85, 89, 90, 95, 99, 100, 102, 107, 113, 117, 123, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2822', '1.800', '0.1467', '1.799', '0.0966', '7.000', '0.7072', 1, 1, 1, 1, 1723731438.3321803]
VI_after__Init : ['1.202', '0.2825', '1.800', '0.1467', '1.801', '0.0911', '7.000', '0.7072', 1, 1, 1, 1, 1723731446.3005948]
VI_at__the_End : ['1.202', '0.4668', '1.800', '0.1371', '1.803', '0.1190', '7.000', '0.7080', 1, 1, 1, 1, 1723731501.7486026]