TEST_NAME : Wafer
TEST_DATE : 24_08_15-16_03_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-013-011-01 | FUSED_ID : 6359364768379228337
  IC_TEMP :  -57.28 | VDDM : 1128.09 | AUX_INT :   -8.75 | CsaBias :   75.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.50734e-03 / 2
  ADC_P0  : -8.75091e-03 ± 2.63466e-02
  ADC_P1  : 8.43860e-03 ± 6.53829e-04
  ADC_P2  : -5.73106e-06 ± 3.21835e-06
  CSA_Chi2/NDF : 1.44587e-04 / 2
  CSA_P0  : 6.02197e-02 ± 8.02024e-03
  CSA_P1  : 9.99473e-03 ± 6.04267e-04
  CSA_P2  : -5.13122e-05 ± 9.20227e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [0, 10, 19, 22, 37, 53, 96, 99, 106, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [0, 31, 32, 40, 65, 88, 93, 99, 110, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.4630', '1.800', '0.1653', '1.799', '0.0971', '7.000', '0.7079', 1, 1, 1, 1, 1723730586.1149096]
VI_after__Init : ['1.202', '0.4639', '1.800', '0.1660', '1.799', '0.0894', '7.000', '0.7074', 1, 1, 1, 1, 1723730594.0943143]
VI_at__the_End : ['1.202', '0.4819', '1.800', '0.1361', '1.799', '0.1135', '7.000', '0.7081', 1, 1, 1, 1, 1723730649.7511177]