TEST_NAME : Wafer
TEST_DATE : 24_08_15-15_59_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-013-013-01 | FUSED_ID : 6359364768379228369
  IC_TEMP :  -55.52 | VDDM : 1130.62 | AUX_INT :   -7.71 | CsaBias :   75.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28570e-03 / 2
  ADC_P0  : -7.71091e-03 ± 2.43034e-02
  ADC_P1  : 8.37636e-03 ± 5.99747e-04
  ADC_P2  : -5.54804e-06 ± 2.94116e-06
  CSA_Chi2/NDF : 1.26758e-04 / 2
  CSA_P0  : 5.87010e-02 ± 7.50947e-03
  CSA_P1  : 9.81671e-03 ± 5.65785e-04
  CSA_P2  : -4.71152e-05 ± 8.61623e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [6, 30, 31, 33, 37, 53, 54, 56, 76, 83, 90, 96, 115, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [0, 15, 24, 33, 42, 75, 81, 91, 92, 94, 109, 114, 126, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4057', '1.800', '0.1338', '1.799', '0.0986', '7.000', '0.7079', 1, 1, 1, 1, 1723730373.6251464]
VI_after__Init : ['1.202', '0.4059', '1.800', '0.1338', '1.800', '0.0914', '7.000', '0.7073', 1, 1, 1, 1, 1723730380.9125314]
VI_at__the_End : ['1.201', '0.4862', '1.800', '0.1368', '1.809', '0.1121', '7.000', '0.7079', 1, 1, 1, 1, 1723730436.463376]