TEST_NAME : Wafer
TEST_DATE : 24_08_15-15_52_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-013-017-06 | FUSED_ID : 6359364768379228438
  IC_TEMP :  -56.57 | VDDM : 1136.80 | AUX_INT : -128.70 | CsaBias :  -18.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22363e-03 / 2
  ADC_P0  : -1.28704e-01 ± 2.97029e-02
  ADC_P1  : 1.01383e-02 ± 6.93164e-04
  ADC_P2  : -1.19249e-05 ± 3.18522e-06
  CSA_Chi2/NDF : 1.46271e-04 / 2
  CSA_P0  : 5.91369e-02 ± 8.06680e-03
  CSA_P1  : 1.02628e-02 ± 6.07775e-04
  CSA_P2  : -5.32208e-05 ± 9.25569e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [0, 6, 16, 19, 36, 40, 43, 46, 51, 67, 104, 115, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [6, 10, 24, 42, 49, 72, 81, 92, 96, 98, 118, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2514', '1.800', '0.1467', '1.800', '0.0916', '7.000', '0.7072', 1, 1, 1, 1, 1723729947.2546442]
VI_after__Init : ['1.202', '0.2514', '1.800', '0.1467', '1.800', '0.0859', '7.000', '0.7072', 1, 1, 1, 1, 1723729955.2980807]
VI_at__the_End : ['1.202', '0.4910', '1.800', '0.1363', '1.803', '0.1126', '7.000', '0.7077', 1, 1, 1, 1, 1723730011.4257684]