TEST_NAME : Wafer
TEST_DATE : 24_08_15-15_50_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-013-018-06 | FUSED_ID : 6359364768379228454
  IC_TEMP :  -52.98 | VDDM : 1126.74 | AUX_INT :   -7.54 | CsaBias :   76.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.47346e-04 / 2
  ADC_P0  : -7.53598e-03 ± 2.07918e-02
  ADC_P1  : 8.50113e-03 ± 5.11287e-04
  ADC_P2  : -6.55209e-06 ± 2.48334e-06
  CSA_Chi2/NDF : 1.00222e-04 / 2
  CSA_P0  : 5.86737e-02 ± 6.67735e-03
  CSA_P1  : 9.54297e-03 ± 5.03090e-04
  CSA_P2  : -4.28970e-05 ± 7.66146e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [2, 3, 46, 52, 55, 84, 88, 89, 92, 101, 105, 108, 112, 113, 116, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [8, 25, 40, 45, 46, 49, 55, 57, 76, 90, 111, 113, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3982', '1.800', '0.1276', '1.799', '0.0977', '7.000', '0.7073', 1, 1, 1, 1, 1723729841.2037797]
VI_after__Init : ['1.202', '0.3985', '1.800', '0.1276', '1.801', '0.0919', '7.000', '0.7074', 1, 1, 1, 1, 1723729849.3902192]
VI_at__the_End : ['1.202', '0.4883', '1.800', '0.1347', '1.799', '0.1115', '7.000', '0.7079', 1, 1, 1, 1, 1723729905.6378381]