TEST_NAME : Wafer
TEST_DATE : 24_08_15-15_41_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-013-023-06 | FUSED_ID : 6359364768379228534
  IC_TEMP :  -50.48 | VDDM : 1128.93 | AUX_INT :   -8.25 | CsaBias :   69.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02165e-03 / 2
  ADC_P0  : -8.24521e-03 ± 2.15884e-02
  ADC_P1  : 8.69898e-03 ± 5.40828e-04
  ADC_P2  : -6.86054e-06 ± 2.68319e-06
  CSA_Chi2/NDF : 8.66493e-05 / 2
  CSA_P0  : 5.89994e-02 ± 6.20876e-03
  CSA_P1  : 9.55133e-03 ± 4.67785e-04
  CSA_P2  : -4.06274e-05 ± 7.12382e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [2, 17, 35, 50, 56, 66, 77, 96, 97, 112, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [24, 39, 42, 80, 102, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1142', '1.800', '0.1305', '1.800', '0.0835', '7.000', '0.7081', 1, 1, 1, 1, 1723729314.7665565]
VI_after__Init : ['1.202', '0.1142', '1.800', '0.1305', '1.800', '0.0761', '7.000', '0.7072', 1, 1, 1, 1, 1723729322.7579274]
VI_at__the_End : ['1.202', '0.4968', '1.800', '0.1360', '1.802', '0.1111', '7.000', '0.7079', 1, 1, 1, 1, 1723729379.5154712]