TEST_NAME : Wafer
TEST_DATE : 24_08_15-15_40_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-013-024-06 | FUSED_ID : 6359364768379228550
  IC_TEMP :  -54.54 | VDDM : 1128.36 | AUX_INT :   -6.01 | CsaBias :   78.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.13862e-04 / 2
  ADC_P0  : -6.01389e-03 ± 1.66967e-02
  ADC_P1  : 8.55031e-03 ± 4.12729e-04
  ADC_P2  : -6.87344e-06 ± 2.00608e-06
  CSA_Chi2/NDF : 7.36280e-05 / 2
  CSA_P0  : 6.02577e-02 ± 5.72326e-03
  CSA_P1  : 9.51830e-03 ± 4.31207e-04
  CSA_P2  : -3.97059e-05 ± 6.56677e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [8, 11, 24, 58, 67, 69, 86, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [20, 36, 46, 65, 75, 109, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2124', '1.800', '0.1578', '1.799', '0.0936', '7.000', '0.7079', 1, 1, 1, 1, 1723729207.8929362]
VI_after__Init : ['1.201', '0.2123', '1.800', '0.1578', '1.800', '0.0866', '7.000', '0.7075', 1, 1, 1, 1, 1723729216.0083342]
VI_at__the_End : ['1.201', '0.4983', '1.800', '0.1365', '1.800', '0.1119', '7.000', '0.7080', 1, 1, 1, 1, 1723729272.229913]