TEST_NAME : Wafer
TEST_DATE : 24_08_15-15_38_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-013-025-06 | FUSED_ID : 6359364768379228566
  IC_TEMP :  -48.04 | VDDM : 1132.03 | AUX_INT :   -5.98 | CsaBias :   74.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.80716e-04 / 2
  ADC_P0  : -5.98407e-03 ± 2.12057e-02
  ADC_P1  : 8.14354e-03 ± 5.10412e-04
  ADC_P2  : -5.43964e-06 ± 2.42641e-06
  CSA_Chi2/NDF : 6.88980e-05 / 2
  CSA_P0  : 6.00271e-02 ± 5.53638e-03
  CSA_P1  : 9.29929e-03 ± 4.17126e-04
  CSA_P2  : -3.61211e-05 ± 6.35233e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [12, 21, 25, 35, 37, 39, 40, 46, 58, 67, 68, 72, 75, 85, 115, 119, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  13
 | P_BROKEN_FAST :  [2, 4, 26, 53, 57, 66, 86, 87, 96, 110, 119, 125, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3368', '1.800', '0.1287', '1.800', '0.0896', '7.000', '0.7075', 1, 1, 1, 1, 1723729101.361164]
VI_after__Init : ['1.202', '0.3368', '1.800', '0.1288', '1.801', '0.0842', '7.000', '0.7072', 1, 1, 1, 1, 1723729109.3996077]
VI_at__the_End : ['1.202', '0.4994', '1.800', '0.1361', '1.803', '0.1096', '7.000', '0.7081', 1, 1, 1, 1, 1723729165.4843078]