TEST_NAME : Wafer
TEST_DATE : 24_08_15-16_19_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-014-003-15 | FUSED_ID : 6359364768379232319
  IC_TEMP :  -69.07 | VDDM : 1117.43 | AUX_INT :  -11.21 | CsaBias :   62.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.91603e-03 / 2
  ADC_P0  : -1.12113e-02 ± 2.96860e-02
  ADC_P1  : 9.26716e-03 ± 7.93210e-04
  ADC_P2  : -7.12022e-06 ± 4.24222e-06
  CSA_Chi2/NDF : 1.66069e-04 / 2
  CSA_P0  : 5.65065e-02 ± 8.59540e-03
  CSA_P1  : 1.09067e-02 ± 6.47601e-04
  CSA_P2  : -6.83441e-05 ± 9.86220e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  17
 | N_BROKEN_FAST :  [1, 12, 31, 39, 41, 45, 52, 53, 54, 55, 62, 63, 80, 104, 107, 111, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [35, 40, 50, 54, 55, 63, 64, 68, 81, 95, 115, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3201', '1.800', '0.1804', '1.800', '0.0961', '7.000', '0.7074', 1, 1, 1, 1, 1723731543.6215234]
VI_after__Init : ['1.202', '0.3208', '1.800', '0.1806', '1.800', '0.0902', '7.000', '0.7072', 1, 1, 1, 1, 1723731551.5669658]
VI_at__the_End : ['1.202', '0.4680', '1.800', '0.1371', '1.802', '0.1144', '7.000', '0.7081', 1, 1, 1, 1, 1723731607.1119134]