TEST_NAME : Wafer
TEST_DATE : 24_08_15-16_29_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-014-009-15 | FUSED_ID : 6359364768379232415
  IC_TEMP :  -63.36 | VDDM : 1127.89 | AUX_INT :   -9.60 | CsaBias :   66.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39424e-03 / 2
  ADC_P0  : -9.60408e-03 ± 2.52702e-02
  ADC_P1  : 8.49657e-03 ± 6.16850e-04
  ADC_P2  : -6.38086e-06 ± 2.99660e-06
  CSA_Chi2/NDF : 1.57581e-04 / 2
  CSA_P0  : 5.85269e-02 ± 8.37286e-03
  CSA_P1  : 1.02230e-02 ± 6.30834e-04
  CSA_P2  : -5.55137e-05 ± 9.60686e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [16, 20, 27, 31, 32, 75, 78, 99, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [27, 30, 37, 42, 55, 68, 74, 102, 110, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1550', '1.800', '0.1570', '1.800', '0.0870', '7.000', '0.7075', 1, 1, 1, 1, 1723732180.5757227]
VI_after__Init : ['1.202', '0.1551', '1.800', '0.1570', '1.800', '0.0820', '7.000', '0.7076', 1, 1, 1, 1, 1723732187.849908]
VI_at__the_End : ['1.202', '0.4778', '1.800', '0.1380', '1.802', '0.1160', '7.000', '0.7079', 1, 1, 1, 1, 1723732244.6466887]