TEST_NAME : Wafer
TEST_DATE : 24_08_15-16_31_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-014-010-15 | FUSED_ID : 6359364768379232431
  IC_TEMP :  -54.56 | VDDM : 1124.70 | AUX_INT :   -8.58 | CsaBias :   80.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48861e-03 / 2
  ADC_P0  : -8.57920e-03 ± 2.61519e-02
  ADC_P1  : 8.17060e-03 ± 6.21732e-04
  ADC_P2  : -5.54287e-06 ± 2.94301e-06
  CSA_Chi2/NDF : 1.12852e-04 / 2
  CSA_P0  : 5.79484e-02 ± 7.08561e-03
  CSA_P1  : 9.72488e-03 ± 5.33850e-04
  CSA_P2  : -4.68553e-05 ± 8.12990e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [5, 7, 13, 23, 26, 30, 35, 44, 46, 95, 98, 100, 110, 113, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [3, 5, 7, 8, 11, 13, 22, 35, 36, 37, 40, 49, 53, 65, 75, 104, 111, 115, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2250', '1.800', '0.1466', '1.800', '0.0849', '7.000', '0.7075', 1, 1, 1, 1, 1723732287.1255627]
VI_after__Init : ['1.202', '0.2251', '1.800', '0.1462', '1.799', '0.0791', '7.000', '0.7072', 1, 1, 1, 1, 1723732294.4679236]
VI_at__the_End : ['1.202', '0.4810', '1.800', '0.1357', '1.800', '0.1121', '7.000', '0.7080', 1, 1, 1, 1, 1723732351.038712]