TEST_NAME : Wafer
TEST_DATE : 24_08_15-16_35_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-014-012-15 | FUSED_ID : 6359364768379232463
  IC_TEMP :  -58.74 | VDDM : 1129.15 | AUX_INT :   -9.00 | CsaBias :   74.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43843e-03 / 2
  ADC_P0  : -8.99918e-03 ± 2.57531e-02
  ADC_P1  : 8.40613e-03 ± 6.43350e-04
  ADC_P2  : -5.15136e-06 ± 3.20312e-06
  CSA_Chi2/NDF : 1.63018e-04 / 2
  CSA_P0  : 5.93487e-02 ± 8.51610e-03
  CSA_P1  : 1.02216e-02 ± 6.41626e-04
  CSA_P2  : -5.36185e-05 ± 9.77121e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [8, 20, 48, 57, 67, 68, 87, 98, 111, 116, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [15, 20, 23, 26, 32, 35, 47, 56, 65, 78, 100, 102, 121, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1245', '1.800', '0.1742', '1.800', '0.0849', '7.000', '0.7072', 1, 1, 1, 1, 1723732499.8605351]
VI_after__Init : ['1.202', '0.1245', '1.800', '0.1742', '1.800', '0.0794', '7.000', '0.7076', 1, 1, 1, 1, 1723732507.8239648]
VI_at__the_End : ['1.202', '0.4860', '1.800', '0.1421', '1.800', '0.1149', '7.000', '0.7081', 1, 1, 1, 1, 1723732564.667694]