TEST_NAME : Wafer
TEST_DATE : 24_08_15-16_54_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-014-023-08 | FUSED_ID : 6359364768379232632
  IC_TEMP :  -49.53 | VDDM : 1129.95 | AUX_INT :   -6.55 | CsaBias :   87.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.64945e-04 / 2
  ADC_P0  : -6.54893e-03 ± 1.87139e-02
  ADC_P1  : 7.92955e-03 ± 4.41477e-04
  ADC_P2  : -4.91682e-06 ± 2.06009e-06
  CSA_Chi2/NDF : 7.70031e-05 / 2
  CSA_P0  : 5.73268e-02 ± 5.85297e-03
  CSA_P1  : 9.47412e-03 ± 4.40979e-04
  CSA_P2  : -3.86760e-05 ± 6.71559e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [0, 15, 17, 20, 21, 33, 45, 56, 64, 73, 88, 116, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  20
 | P_BROKEN_FAST :  [4, 10, 14, 18, 21, 24, 26, 47, 54, 55, 62, 67, 70, 77, 97, 105, 109, 117, 122, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1345', '1.800', '0.1220', '1.799', '0.0870', '7.000', '0.7086', 1, 1, 1, 1, 1723733671.8474233]
VI_after__Init : ['1.202', '0.1345', '1.800', '0.1219', '1.800', '0.0796', '7.000', '0.7076', 1, 1, 1, 1, 1723733679.7988348]
VI_at__the_End : ['1.202', '0.4976', '1.800', '0.1374', '1.801', '0.1100', '7.000', '0.7085', 1, 1, 1, 1, 1723733736.2176247]