TEST_NAME : Wafer
TEST_DATE : 24_08_15-17_22_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-015-013-02 | FUSED_ID : 6359364768379236562
  IC_TEMP :  -62.77 | VDDM : 1128.81 | AUX_INT :   -7.74 | CsaBias :   68.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41239e-03 / 2
  ADC_P0  : -7.73654e-03 ± 2.55290e-02
  ADC_P1  : 8.54602e-03 ± 6.51407e-04
  ADC_P2  : -5.21557e-06 ± 3.31156e-06
  CSA_Chi2/NDF : 1.79065e-04 / 2
  CSA_P0  : 6.13753e-02 ± 8.92539e-03
  CSA_P1  : 1.09607e-02 ± 6.72464e-04
  CSA_P2  : -6.50507e-05 ± 1.02408e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [3, 49, 54, 57, 71, 83, 101, 109, 110, 114, 117, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [1, 10, 14, 23, 29, 34, 36, 45, 46, 50, 64, 72, 95, 99, 103, 105, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2110', '1.800', '0.1220', '1.799', '0.0838', '7.000', '0.7086', 1, 1, 1, 1, 1723735368.3886003]
VI_after__Init : ['1.202', '0.2110', '1.800', '0.1220', '1.800', '0.0763', '7.000', '0.7076', 1, 1, 1, 1, 1723735376.422767]
VI_at__the_End : ['1.202', '0.4881', '1.800', '0.1414', '1.803', '0.1163', '7.000', '0.7084', 1, 1, 1, 1, 1723735432.5384421]