TEST_NAME : Wafer
TEST_DATE : 24_08_15-17_10_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-015-020-05 | FUSED_ID : 6359364768379236677
  IC_TEMP :  -56.01 | VDDM : 1117.59 | AUX_INT :  -10.27 | CsaBias :   62.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.89879e-03 / 2
  ADC_P0  : -1.02742e-02 ± 2.96189e-02
  ADC_P1  : 8.07737e-03 ± 7.04399e-04
  ADC_P2  : -4.89341e-06 ± 3.34765e-06
  CSA_Chi2/NDF : 1.43167e-04 / 2
  CSA_P0  : 5.79601e-02 ± 7.98076e-03
  CSA_P1  : 9.66562e-03 ± 6.01292e-04
  CSA_P2  : -4.73368e-05 ± 9.15697e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [3, 14, 19, 22, 29, 62, 65, 84, 93, 102, 116, 119, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [3, 25, 28, 31, 37, 41, 51, 66, 68, 77, 83, 93, 94, 103, 107, 113, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2638', '1.800', '0.1384', '1.799', '0.0908', '7.000', '0.7083', 1, 1, 1, 1, 1723734629.1154103]
VI_after__Init : ['1.202', '0.2638', '1.800', '0.1384', '1.802', '0.0831', '7.000', '0.7077', 1, 1, 1, 1, 1723734637.1998067]
VI_at__the_End : ['1.202', '0.4770', '1.800', '0.1355', '1.800', '0.1127', '7.000', '0.7085', 1, 1, 1, 1, 1723734693.6424732]