TEST_NAME : Wafer
TEST_DATE : 24_08_15-17_05_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-015-023-05 | FUSED_ID : 6359364768379236725
  IC_TEMP :  -47.64 | VDDM : 1112.96 | AUX_INT :   -7.70 | CsaBias :   92.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07444e-03 / 2
  ADC_P0  : -7.70225e-03 ± 2.22125e-02
  ADC_P1  : 7.77259e-03 ± 5.09785e-04
  ADC_P2  : -4.80271e-06 ± 2.32007e-06
  CSA_Chi2/NDF : 7.03599e-05 / 2
  CSA_P0  : 5.92012e-02 ± 5.59480e-03
  CSA_P1  : 9.30159e-03 ± 4.21528e-04
  CSA_P2  : -3.67482e-05 ± 6.41937e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [12, 35, 40, 51, 94, 100, 102, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [5, 13, 40, 47, 93, 94, 122, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1665', '1.800', '0.1478', '1.799', '0.0905', '7.000', '0.7076', 1, 1, 1, 1, 1723734310.1363769]
VI_after__Init : ['1.202', '0.1665', '1.800', '0.1477', '1.800', '0.0846', '7.000', '0.7075', 1, 1, 1, 1, 1723734318.1547825]
VI_at__the_End : ['1.201', '0.4964', '1.800', '0.1345', '1.800', '0.1096', '7.000', '0.7084', 1, 1, 1, 1, 1723734374.3865447]