TEST_NAME : Wafer
TEST_DATE : 24_08_15-17_52_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-016-013-10 | FUSED_ID : 6359364768379240666
  IC_TEMP :  -48.67 | VDDM : 1111.40 | AUX_INT :  -10.61 | CsaBias :   81.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.07706e-03 / 2
  ADC_P0  : -1.06148e-02 ± 3.09708e-02
  ADC_P1  : 8.43088e-03 ± 7.60572e-04
  ADC_P2  : -5.74122e-06 ± 3.72395e-06
  CSA_Chi2/NDF : 1.15558e-04 / 2
  CSA_P0  : 5.98483e-02 ± 7.17004e-03
  CSA_P1  : 9.77107e-03 ± 5.40211e-04
  CSA_P2  : -4.44514e-05 ± 8.22678e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [2, 11, 16, 24, 26, 33, 43, 44, 61, 62, 65, 74, 80, 83, 96, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [5, 11, 25, 47, 49, 60, 72, 104, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1293', '1.800', '0.1561', '1.800', '0.0870', '7.000', '0.7072', 1, 1, 1, 1, 1723737174.3390934]
VI_after__Init : ['1.202', '0.1293', '1.800', '0.1560', '1.801', '0.0814', '7.000', '0.7073', 1, 1, 1, 1, 1723737182.3335266]
VI_at__the_End : ['1.202', '0.4952', '1.800', '0.1372', '1.800', '0.1097', '7.000', '0.7077', 1, 1, 1, 1, 1723737237.8750243]