TEST_NAME : Wafer
TEST_DATE : 24_08_15-17_58_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-016-016-13 | FUSED_ID : 6359364768379240717
  IC_TEMP :  -50.89 | VDDM : 1127.17 | AUX_INT :   -9.16 | CsaBias :   84.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37104e-03 / 2
  ADC_P0  : -9.16442e-03 ± 2.50989e-02
  ADC_P1  : 7.87117e-03 ± 5.76699e-04
  ADC_P2  : -5.05072e-06 ± 2.63832e-06
  CSA_Chi2/NDF : 7.92997e-05 / 2
  CSA_P0  : 5.74731e-02 ± 5.93961e-03
  CSA_P1  : 9.28979e-03 ± 4.47507e-04
  CSA_P2  : -3.93542e-05 ± 6.81500e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [12, 13, 16, 17, 20, 33, 40, 44, 66, 67, 78, 82, 106, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [13, 25, 28, 53, 58, 63, 75, 78, 79, 92, 105, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3161', '1.800', '0.1750', '1.799', '0.0931', '6.997', '0.7070', 1, 1, 1, 1, 1723737487.7399557]
VI_after__Init : ['1.202', '0.3161', '1.800', '0.1750', '1.800', '0.0878', '7.000', '0.7072', 1, 1, 1, 1, 1723737495.6703155]
VI_at__the_End : ['1.202', '0.4834', '1.800', '0.1314', '1.803', '0.1096', '7.000', '0.7077', 1, 1, 1, 1, 1723737552.0588617]