TEST_NAME : Wafer
TEST_DATE : 24_08_15-18_38_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-017-007-07 | FUSED_ID : 6359364768379244663
  IC_TEMP :  -55.54 | VDDM : 1109.32 | AUX_INT :   -9.41 | CsaBias :   60.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45958e-03 / 2
  ADC_P0  : -9.41095e-03 ± 2.58650e-02
  ADC_P1  : 8.81898e-03 ± 6.56224e-04
  ADC_P2  : -6.96301e-06 ± 3.30265e-06
  CSA_Chi2/NDF : 2.15390e-04 / 2
  CSA_P0  : 5.57396e-02 ± 9.78892e-03
  CSA_P1  : 9.77549e-03 ± 7.37524e-04
  CSA_P2  : -4.87092e-05 ± 1.12316e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [0, 5, 13, 14, 26, 34, 54, 71, 72, 84, 98, 116, 117, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [8, 13, 27, 40, 55, 59, 61, 64, 72, 77, 80, 83, 107, 115, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2429', '1.800', '0.1308', '1.800', '0.0852', '7.000', '0.7086', 1, 1, 1, 1, 1723739935.3760448]
VI_after__Init : ['1.201', '0.2431', '1.800', '0.1308', '1.800', '0.0782', '7.000', '0.7076', 1, 1, 1, 1, 1723739943.4785469]
VI_at__the_End : ['1.202', '0.4736', '1.800', '0.1431', '1.800', '0.1123', '7.000', '0.7084', 1, 1, 1, 1, 1723739999.4947948]