TEST_NAME : Wafer
TEST_DATE : 24_08_15-18_31_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-017-011-07 | FUSED_ID : 6359364768379244727
  IC_TEMP :  -57.21 | VDDM : 1126.89 | AUX_INT :  -44.11 | CsaBias :   44.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74837e-03 / 2
  ADC_P0  : -4.41148e-02 ± 3.05639e-02
  ADC_P1  : 8.90725e-03 ± 7.51599e-04
  ADC_P2  : -7.03472e-06 ± 3.65482e-06
  CSA_Chi2/NDF : 1.52568e-04 / 2
  CSA_P0  : 5.69879e-02 ± 8.23861e-03
  CSA_P1  : 9.89189e-03 ± 6.20720e-04
  CSA_P2  : -5.02251e-05 ± 9.45283e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [14, 41, 79, 108, 112, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [17, 42, 45, 61, 83, 96, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3117', '1.800', '0.1306', '1.799', '0.0921', '7.000', '0.7076', 1, 1, 1, 1, 1723739509.7534997]
VI_after__Init : ['1.202', '0.3119', '1.800', '0.1306', '1.800', '0.0865', '7.000', '0.7075', 1, 1, 1, 1, 1723739517.7960548]
VI_at__the_End : ['1.201', '0.4765', '1.800', '0.1348', '1.804', '0.1133', '7.000', '0.7085', 1, 1, 1, 1, 1723739573.836851]