TEST_NAME : Wafer
TEST_DATE : 24_08_15-18_30_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-017-012-07 | FUSED_ID : 6359364768379244743
  IC_TEMP :  -60.02 | VDDM : 1136.91 | AUX_INT :   -6.30 | CsaBias :   68.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.12182e-04 / 2
  ADC_P0  : -6.30074e-03 ± 1.92813e-02
  ADC_P1  : 8.41855e-03 ± 4.79325e-04
  ADC_P2  : -5.90395e-06 ± 2.34990e-06
  CSA_Chi2/NDF : 1.83982e-04 / 2
  CSA_P0  : 5.93001e-02 ± 9.04712e-03
  CSA_P1  : 1.01852e-02 ± 6.81635e-04
  CSA_P2  : -5.23290e-05 ± 1.03805e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [11, 26, 30, 31, 49, 63, 64, 76, 89, 93, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [28, 36, 49, 58, 59, 65, 66, 77, 78, 82, 98, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3047', '1.800', '0.1102', '1.799', '0.0898', '7.000', '0.7082', 1, 1, 1, 1, 1723739404.0831606]
VI_after__Init : ['1.202', '0.3049', '1.800', '0.1103', '1.799', '0.0823', '7.000', '0.7076', 1, 1, 1, 1, 1723739412.0567837]
VI_at__the_End : ['1.202', '0.4885', '1.800', '0.1368', '1.801', '0.1156', '7.000', '0.7084', 1, 1, 1, 1, 1723739468.9287055]