TEST_NAME : Wafer
TEST_DATE : 24_08_15-18_15_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-017-020-00 | FUSED_ID : 6359364768379244864
  IC_TEMP :  -73.85 | VDDM : 1196.03 | AUX_INT : -758.24 | CsaBias : -534.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.47351e-02 / 2
  ADC_P0  : -7.58237e-01 ± 2.23762e-01
  ADC_P1  : 1.91849e-02 ± 4.30954e-03
  ADC_P2  : -4.29128e-05 ± 1.69515e-05
  CSA_Chi2/NDF : 1.66275e-04 / 2
  CSA_P0  : 5.61173e-02 ± 8.60074e-03
  CSA_P1  : 1.00740e-02 ± 6.48004e-04
  CSA_P2  : -4.99201e-05 ± 9.86833e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  14
 | N_BROKEN_FAST :  [1, 23, 35, 56, 57, 65, 69, 72, 74, 86, 102, 110, 114, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  16
 | P_BROKEN_FAST :  [3, 5, 7, 34, 38, 52, 61, 65, 68, 71, 86, 90, 102, 107, 118, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2785', '1.800', '0.1294', '1.800', '0.0866', '7.000', '0.7070', 1, 1, 1, 1, 1723738553.3318322]
VI_after__Init : ['1.201', '0.2790', '1.800', '0.1295', '1.800', '0.0808', '7.000', '0.7070', 1, 1, 1, 1, 1723738561.3932147]
VI_at__the_End : ['1.202', '0.4881', '1.800', '0.1338', '1.799', '0.1130', '7.000', '0.7079', 1, 1, 1, 1, 1723738617.5356936]