TEST_NAME : Wafer
TEST_DATE : 24_08_15-18_40_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-018-009-09 | FUSED_ID : 6359364768379248793
  IC_TEMP :  -62.20 | VDDM : 1118.83 | AUX_INT :   -9.96 | CsaBias :   82.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72129e-03 / 2
  ADC_P0  : -9.95672e-03 ± 2.82014e-02
  ADC_P1  : 8.46941e-03 ± 7.09355e-04
  ADC_P2  : -5.05496e-06 ± 3.56924e-06
  CSA_Chi2/NDF : 2.63840e-04 / 2
  CSA_P0  : 5.54921e-02 ± 1.08341e-02
  CSA_P1  : 9.98150e-03 ± 8.16271e-04
  CSA_P2  : -5.27762e-05 ± 1.24308e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [12, 20, 45, 49, 69, 71, 102, 113, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [6, 37, 57, 66, 78, 82, 87, 88, 93, 97, 105, 117, 119, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1768', '1.800', '0.1781', '1.800', '0.0905', '7.000', '0.7077', 1, 1, 1, 1, 1723740042.2488108]
VI_after__Init : ['1.202', '0.1771', '1.800', '0.1782', '1.801', '0.0847', '7.000', '0.7076', 1, 1, 1, 1, 1723740050.3303206]
VI_at__the_End : ['1.201', '0.4696', '1.800', '0.1332', '1.799', '0.1151', '7.000', '0.7084', 1, 1, 1, 1, 1723740105.6555476]