TEST_NAME : Wafer
TEST_DATE : 24_08_15-18_44_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-006-018-011-09 | FUSED_ID : 6359364768379248825
  IC_TEMP :  -58.25 | VDDM : 1119.46 | AUX_INT :  -64.13 | CsaBias :   19.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64869e-03 / 2
  ADC_P0  : -6.41347e-02 ± 3.08602e-02
  ADC_P1  : 9.32296e-03 ± 7.61969e-04
  ADC_P2  : -8.32980e-06 ± 3.71259e-06
  CSA_Chi2/NDF : 1.73861e-04 / 2
  CSA_P0  : 5.89806e-02 ± 8.79475e-03
  CSA_P1  : 9.71621e-03 ± 6.62621e-04
  CSA_P2  : -4.88655e-05 ± 1.00909e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  13
 | N_BROKEN_FAST :  [3, 4, 41, 49, 75, 78, 84, 87, 89, 104, 117, 122, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  15
 | P_BROKEN_FAST :  [1, 9, 25, 42, 43, 54, 68, 79, 85, 89, 92, 96, 97, 117, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2548', '1.800', '0.1658', '1.800', '0.0923', '7.000', '0.7076', 1, 1, 1, 1, 1723740255.4578843]
VI_after__Init : ['1.202', '0.2548', '1.800', '0.1659', '1.800', '0.0863', '7.000', '0.7076', 1, 1, 1, 1, 1723740263.4053206]
VI_at__the_End : ['1.202', '0.4728', '1.800', '0.1372', '1.803', '0.1132', '7.000', '0.7084', 1, 1, 1, 1, 1723740317.2785256]